About this Engineering article
ON-Resistance of Ga2O3 Trench-MOS Schottky Barrier Diodes: Role of Sidewall Interface Trapping by Li, Wenshen (author);Nomoto, Kazuki (author);Hu, Zongyang (author);Jena, Debdeep (author);Xing, Huili Grace (author) is a Engineering article available to read on EtoBox.
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- Author
- Li, Wenshen (author);Nomoto, Kazuki (author);Hu, Zongyang (author);Jena, Debdeep (author);Xing, Huili Grace (author)
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Published
- 2021
- Field
- Engineering (Physical Sciences)