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About this Computer Science article
Revisiting Supervised and Unsupervised Methods for Effort-Aware Cross-Project Defect Prediction by Ni, Chao; Xia, Xin; Lo, David; Chen, Xiang; Gu, Qing is a Computer Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- Ni, Chao; Xia, Xin; Lo, David; Chen, Xiang; Gu, Qing
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0098-5589)
- Published
- 2020
- Field
- Computer Science (Physical Sciences)
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