About this scholarly article

TRANSDUCERS '03. 12th International Conference on Solid-State Sensors, Actuators and Microsystems. Digest of Technical Papers (Cat. No.03TH8664) - A testing procedure at wafer level for micro electrodes using a gel by Kindlundh, M.G.; Norlin, P. is a scholarly article available to read on EtoBox.

Author

Kindlundh, M.G.; Norlin, P.

Publisher

IEEE

Published

2003

Language

EN