About this scholarly article

2016 IEEE Uttar Pradesh Section International Conference on Electrical, Computer and Electronics Engineering (UPCON) - Carrier concentration dependence of ballistic mobility and mean free path in a nano-dimensional InAlAs/InGaAs single gate HEMT by Sharma, Neetika; Jogi, Jyotika; Gupta, R.S is a scholarly article available to read on EtoBox.

Author

Sharma, Neetika; Jogi, Jyotika; Gupta, R.S

Publisher

IEEE

Published

2016

Language

EN