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About this Engineering article
Reliability of Consecutive-k-out-of-n:F System by Chiang, Dalen T.; Niu, Shun-Chen is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Chiang, Dalen T.; Niu, Shun-Chen
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9529)
- Published
- 1981
- Language
- EN
- Field
- Engineering (Physical Sciences)