About this scholarly article

2012 IEEE International Ultrasonics Symposium - Characterization of thin layers using a frequency domain laser-ultrasonic system by Grunsteidl, C.; Roither, J.; Veres, I. A.; Reitinger, B.; Berer, T.; Grun, H.; Burgholzer, P.; Kostenbauer, H.; Winkler, J.; Traxler, H.; Veres, I. A.; Berer, T.; Burgholzer, P. is a scholarly article available to read on EtoBox.

Author

Grunsteidl, C.; Roither, J.; Veres, I. A.; Reitinger, B.; Berer, T.; Grun, H.; Burgholzer, P.; Kostenbauer, H.; Winkler, J.; Traxler, H.; Veres, I. A.; Berer, T.; Burgholzer, P.

Publisher

IEEE

Published

2012

Language

EN