About this scholarly article

2009 33rd Annual IEEE International Computer Software and Applications Conference - Test Case Mutation in Hybrid State Space for Reduction of No-Fault-Found Test Results in the Industrial Automation Domain by Ruschival, Thomas; Nenninger, Philipp; Kantz, Florian; Streitferdt, Detlef is a scholarly article available to read on EtoBox.

Author

Ruschival, Thomas; Nenninger, Philipp; Kantz, Florian; Streitferdt, Detlef

Publisher

IEEE

Published

2009

Language

EN