About this scholarly article

2006 IEEE Sarnoff Symposium - A non contact characterization technique of the defect states of high k dielectrics using THz radiation by Sengupta, Amartya; Bandyopadhyay, Aparajita; Federici, John F.; Grebel, Haim; Pham, Daniel is a scholarly article available to read on EtoBox.

Author

Sengupta, Amartya; Bandyopadhyay, Aparajita; Federici, John F.; Grebel, Haim; Pham, Daniel

Publisher

IEEE

Published

2006