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About this Engineering article
High Spatial Resolution Quantitative Microwave Impedance Microscopy by a Scanning Tip Microwave Near-field Microscope by Gao, Chen; Wei, Tao; Duewer, Fred; Lu, Yalin; Xiang, X.-D. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Gao, Chen; Wei, Tao; Duewer, Fred; Lu, Yalin; Xiang, X.-D.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 1997
- Language
- EN
- Field
- Engineering (Physical Sciences)