About this scholarly article

SPIE Proceedings [SPIE 31st Annual Technical Symposium - San Diego, CA (Sunday 17 August 1986)] Raman and Luminescence Spectroscopy in Technology - Raman Scattering From Rapid Thermally Annealed Tungsten Silicide Thin Films by Jackson, Howard E.; Boyd, Joseph T.; Ramabadran, U.; Vuppuladhadium, R.; Adar, Fran; Griffiths, James E. is a scholarly article available to read on EtoBox.

Author

Jackson, Howard E.; Boyd, Joseph T.; Ramabadran, U.; Vuppuladhadium, R.; Adar, Fran; Griffiths, James E.

Publisher

SPIE

Published

1988