Skip to content

Opening book details…

About this Engineering article

Thermally Induced Atomic Transport in Nanometric LaAlON Films on Si by Bastos, K. P.; Salvador, L.; Krug, C.; Edon, V.; Hugon, M. C.; Agius, B.; Baumvol, I. J. R. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Bastos, K. P.; Salvador, L.; Krug, C.; Edon, V.; Hugon, M. C.; Agius, B.; Baumvol, I. J. R.
Publisher
The Electrochemical Society; Electrochemical Society, Inc. (ISSN 1099-0062)
Published
2007
Language
EN
Field
Engineering (Physical Sciences)

More by Bastos, K. P.; Salvador, L.; Krug, C.; Edon, V.; Hugon, M. C.; Agius, B.; Baumvol, I. J. R.

Browse all works by Bastos, K. P.; Salvador, L.; Krug, C.; Edon, V.; Hugon, M. C.; Agius, B.; Baumvol, I. J. R.