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About this Engineering article
Is there a reliable screen for VHF power transistors? : D. Sulway, J. Ingram-Cotton and J. P. M. Leduc. Proceedings 1972 Annual Reliability and Maintainability Symposium, San Francisco. IEEE Cat. No. 72CH0577-7R. 25–27 January (1972), p. 533 is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 1972
- Language
- EN
- Field
- Engineering (Physical Sciences)