About this scholarly article

Proceedings of the IEEE 1991 Custom Integrated Circuits Conference - The architecture of the GenTest sequential test generator by Bencivenga, R.; Chakraborty, T.J.; Davidson, S. is a scholarly article available to read on EtoBox.

Author

Bencivenga, R.; Chakraborty, T.J.; Davidson, S.

Publisher

IEEE

Published

1991