About this scholarly article

2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) - Evaluation of mission success for binary system with repairable spare parts by Cai, Z. Q.; Guo, P.; Li, Y.; Si, W. T. is a scholarly article available to read on EtoBox.

Author

Cai, Z. Q.; Guo, P.; Li, Y.; Si, W. T.

Publisher

IEEE

Published

2016

Language

EN