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About this Engineering article
Carrier Trapping by Oxygen Impurities in Molybdenum Diselenide by Chen, Ke; Roy, Anupam; Rai, Amritesh; Valsaraj, Amithraj; Meng, Xianghai; He, Feng; Xu, Xiaochuan; Register, Leonard Frank; Banerjee, Sanjay K.; Wang, Yaguo is a Engineering article available to read on EtoBox.
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- Author
- Chen, Ke; Roy, Anupam; Rai, Amritesh; Valsaraj, Amithraj; Meng, Xianghai; He, Feng; Xu, Xiaochuan; Register, Leonard Frank; Banerjee, Sanjay K.; Wang, Yaguo
- Publisher
- American Chemical Society; American Chemical Society (ACS) (ISSN 1944-8244)
- Published
- 2017
- Field
- Engineering (Physical Sciences)