Opening book details…
About this Engineering article
Collision strengths and Gaunt factors for highly ionized atoms of the copper isoelectronic sequence by S.M. Younger is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- S.M. Younger
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0022-4073)
- Published
- 1979
- Language
- EN
- Field
- Engineering (Physical Sciences)