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About this Engineering article
Transition Edge X-ray Sensor Using Anodic Bonding Wafer by Tanaka, Keiichi; Morooka, Toshimitsu; Nakayama, Satoshi; Chinone, Kazuo is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Tanaka, Keiichi; Morooka, Toshimitsu; Nakayama, Satoshi; Chinone, Kazuo
- Publisher
- Japan Science and Technology Information Aggregator, Electronic; Institute Electrical Engineers Japan; The Institute of Electrical Engineers of Japan; Institute of Electrical Engineers of Japan (IEE Japan); Test accounts (ISSN 1341-8939)
- Published
- 2002
- Language
- EN
- Field
- Engineering (Physical Sciences)
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