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About this Physics and Astronomy article
An Electronic Criterion for Assessing Intrinsic Brittleness of Metallic Glasses by Wang, X. F.; Jones, T. E.; Wu, Y.; Lu, Z. P.; Halas, S.; Durakiewicz, T.; Eberhart, M. E. is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Wang, X. F.; Jones, T. E.; Wu, Y.; Lu, Z. P.; Halas, S.; Durakiewicz, T.; Eberhart, M. E.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0021-9606)
- Published
- 2014
- Field
- Physics and Astronomy (Physical Sciences)