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About this Engineering article
Competition between Auger Recombination and Hot‐Carrier Trapping in PL Intensity Fluctuations of Type II Nanocrystals by Mangum, Benjamin D.; Wang, Feng; Dennis, Allison M.; Gao, Yongqian; Ma, Xuedan; Hollingsworth, Jennifer A.; Htoon, Han is a Engineering article available to read on EtoBox.
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- Author
- Mangum, Benjamin D.; Wang, Feng; Dennis, Allison M.; Gao, Yongqian; Ma, Xuedan; Hollingsworth, Jennifer A.; Htoon, Han
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); Wiley - V C H Verlag GmbbH & Co.; Publons; Wiley (ISSN 1613-6810)
- Published
- 2014
- Field
- Engineering (Physical Sciences)