About this scholarly article

Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Electron bunch shape measurements at the TTF-FEL by Honkavaara, K.; Schreiber, S.; Gerth, Ch.; Piot, Ph. is a scholarly article available to read on EtoBox.

Author

Honkavaara, K.; Schreiber, S.; Gerth, Ch.; Piot, Ph.

Publisher

IEEE

Published

2003