About this scholarly article

2008 European Conference on Radiation and Its Effects on Components and Systems - Gate rupture in ultra-thin gate oxides irradiated with heavy ions by Silvestri, M.; Gerardin, S.; Paccagnella, A.; Ghidini, G. is a scholarly article available to read on EtoBox.

Author

Silvestri, M.; Gerardin, S.; Paccagnella, A.; Ghidini, G.

Publisher

IEEE

Published

2008

Language

EN