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About this scholarly article
SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2014 - Beijing, China (Tuesday 13 May 2014)] International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors - Digital holographic inspection for a straight pipe inner surface using multiwavelength illuminations by Czarske, Jurgen; Zhang, Shulian; Sampson, David; Wang, Wei; Liao, Yanbiao; Yokota, Masayuki is a scholarly article available to read on EtoBox.
- Author
- Czarske, Jurgen; Zhang, Shulian; Sampson, David; Wang, Wei; Liao, Yanbiao; Yokota, Masayuki
- Publisher
- SPIE
- Published
- 2014