About this scholarly article

First International Symposium on Empirical Software Engineering and Measurement (ESEM 2007) - How Software Designs Decay: A Pilot Study of Pattern Evolution by Izurieta, Clemente; Bieman, James M. is a scholarly article available to read on EtoBox.

Author

Izurieta, Clemente; Bieman, James M.

Publisher

IEEE

Published

2007

Language

EN