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About this Engineering article
Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling by Sabbah, Wissam; Arabi, Faical; Avino-Salvado, Oriol; Buttay, Cyril; Théolier, Loïc; Morel, Hervé is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Sabbah, Wissam; Arabi, Faical; Avino-Salvado, Oriol; Buttay, Cyril; Théolier, Loïc; Morel, Hervé
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 2017
- Language
- EN
- Field
- Engineering (Physical Sciences)