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What is Microcrystalline Property Analysis Methods about?

This document provides a historical overview of methods used to analyze diffraction line profiles to study microcrystalline properties of materials. Early methods in the 1900s used measurements like full width at half maximum and integral breadth. In the 1960s, Fourier and variance methods became preferred as they provide more detailed information but require well-resolved diffraction lines. Recent developments in pattern decomposition methods allow the analysis of complex patterns with overlapping peaks. C

Author

Ana Maria Trandafir

Language

EN