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About this Engineering article
An analytical model for pinchoff voltage evaluation of ion-implanted GaAs MESFETs by Dutt, M.B.; Nath, R.; Kumar, R.; Sharma, B.L. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Dutt, M.B.; Nath, R.; Kumar, R.; Sharma, B.L.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 1989
- Language
- EN
- Field
- Engineering (Physical Sciences)
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