About this scholarly article

SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Phase object power mapping and cosmetic defects enhancement by Fourier-based deflectometry by Beghuin, D.; Lehmann, Peter H.; Dubois, X.; Joannes, L. is a scholarly article available to read on EtoBox.

Author

Beghuin, D.; Lehmann, Peter H.; Dubois, X.; Joannes, L.

Publisher

SPIE

Published

2009

Language

EN