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Precision Metrology Meets Cosmology: Improved Constraints on Ultralight Dark Matter from Atom-Cavity Frequency Comparisons by Kennedy, Colin J.; Oelker, Eric; Robinson, John M.; Bothwell, Tobias; Kedar, Dhruv; Milner, William R.; Marti, G. Edward; Derevianko, Andrei; Ye, Jun is a Physics and Astronomy article available to read on EtoBox.

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Author
Kennedy, Colin J.; Oelker, Eric; Robinson, John M.; Bothwell, Tobias; Kedar, Dhruv; Milner, William R.; Marti, G. Edward; Derevianko, Andrei; Ye, Jun
Publisher
The American Physical Society; American Physical Society; American Physical Society (APS) (ISSN 0031-9007)
Published
2020
Field
Physics and Astronomy (Physical Sciences)