About this scholarly article

2016 IEEE International Reliability Physics Symposium (IRPS) - On conduction mechanisms through SiN/AlGaN based gate dielectric and assessment of intrinsic reliability by Banerjee, Abhishek; Vanmeerbeek, Piet; De Schepper, Luc; Vandeweghe, Steven; Coppens, Peter; Moens, Peter is a scholarly article available to read on EtoBox.

Author

Banerjee, Abhishek; Vanmeerbeek, Piet; De Schepper, Luc; Vandeweghe, Steven; Coppens, Peter; Moens, Peter

Publisher

IEEE

Published

2016

Language

EN