About this scholarly article

Accurate error bit mode analysis of STT-MRAM chip with a novel current measurement module implemented to gigabit class memory test system by Tamura, R. ;Mori, I. ;Watanabe, N. ;Koike, H. ;Endoh, T. is a scholarly article available to read on EtoBox.

Author

Tamura, R. ;Mori, I. ;Watanabe, N. ;Koike, H. ;Endoh, T.

Publisher

IEEE

Published

2018