About this scholarly article

2018 International Conference on Innovations in Science, Engineering and Technology (ICISET) - Short Channel Effects Characterization of 3-D FinFET for High-k Gate Dielectrics by Ahmed Zaki, Zunaid; Tanjila, Noshin; Saha, Jibesh K. is a scholarly article available to read on EtoBox.

Author

Ahmed Zaki, Zunaid; Tanjila, Noshin; Saha, Jibesh K.

Publisher

IEEE

Published

2018