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Micrometry combined with profile mapping for the absolute measurement of Integrated Column Density (ICD) and for accurate X-ray mass attenuation coefficients using XERT by M. Tauhidul Islam; Nicholas A. Rae; Jack L. Glover; Zwi Barnea; Christopher T. Chantler is a Physics and Astronomy article available to read on EtoBox.

What is Micrometry combined with profile mapping for the absolute measurement of Integrated Column Density (ICD) and for accurate X-ray mass attenuation coefficients using XERT about?

Absolute values of the column densities 1⁄2rt c of four gold foils were measured using micrometry combined with the 2D X-ray attenuation profile. The absolute calibration of 1⁄2rt c was made with a reference foil and the 1⁄2rt c of other foils were determined following the thickness transfer method. By this method, we obtain absolute calibration to 0.1% or better which was not possible using only the X-ray map of a single foil over its central region.

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Author

M. Tauhidul Islam; Nicholas A. Rae; Jack L. Glover; Zwi Barnea; Christopher T. Chantler

Publisher

Elsevier Science; Elsevier ; Elsevier BV; ScienceOpen (ISSN 0168-9002)

Published

2010

Language

EN

Field

Physics and Astronomy (Physical Sciences)