Opening book details…
About this Engineering article
Predicting the Single-Event Error Rate of a Radiation Hardened by Design Microprocessor by Cabanas-Holmen, Manuel; Cannon, Ethan H.; Amort, Tony; Ballast, Jon; Brees, Roger; Fischer, Steve; Kleinosowski, A. J.; Meaker, Barry; Swann, Terry; Wert, Jerry is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Cabanas-Holmen, Manuel; Cannon, Ethan H.; Amort, Tony; Ballast, Jon; Brees, Roger; Fischer, Steve; Kleinosowski, A. J.; Meaker, Barry; Swann, Terry; Wert, Jerry
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
- Published
- 2011
- Language
- EN
- Field
- Engineering (Physical Sciences)