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What is Partial Scan Fault Coverage Method about?
This paper proposes a test generation-based partial scan selection procedure that achieves full fault coverage by scanning only a subset of flip-flops (ip-ops). The method utilizes new measures to guide the selection of ip-ops and is validated on benchmark circuits, demonstrating that it can match the fault coverage of full scan designs while scanning fewer ip-ops. The procedure consists of three phases: identifying unobservable and uncontrollable ip-ops, detecting sequentially undetectable faults, and sele
- Author
- How Hwan
- Language
- EN