About this scholarly article

Conference on Optoelectronic and Microelectronic Materials and Devices, 2004. - Modeling the Effects of Interface Traps on Scanning Capacitance Microscopy dC/dV Measurement by Hong, Y.D.; Yeow, Y.T. is a scholarly article available to read on EtoBox.

Author

Hong, Y.D.; Yeow, Y.T.

Publisher

IEEE

Published

2004