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What is LFSR Polynomial Methodology for Testing about?

This document discusses using linear feedback shift registers (LFSRs) for pseudo-exhaustive test pattern generation for digital circuits. It presents a methodology to enlarge the list of candidate characteristic polynomials for the LFSR if more than one seed is allowed. Experimental results show that the additional candidate polynomials identified by this methodology often help satisfy the given test length and seed restriction requirements.

Author

eswar chand

Language

EN