About this scholarly article

SPIE Proceedings [SPIE Fifth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering - St. Petersburg, Russia (Tuesday 12 June 2001)] Fifth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering - Nucleation of SiC on Si and their relationship to nano-dot formation: I. Experimental investigations by Scharmann, F.; Pezoldt, Joerg; Melker, Alexander I. is a scholarly article available to read on EtoBox.

Author

Scharmann, F.; Pezoldt, Joerg; Melker, Alexander I.

Publisher

SPIE

Published

2002

Language

EN