Opening book details…
About this Materials Science article
SIMS as a subnanometer probe: A new tool for chemical profile analysis of grafted molecules by Frédéric Chérioux; Bernard Gauthier-Manuel; John Eccles; Thierry Grenut; Marc Briant is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Frédéric Chérioux; Bernard Gauthier-Manuel; John Eccles; Thierry Grenut; Marc Briant
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0169-4332)
- Published
- 2007
- Field
- Materials Science (Physical Sciences)