About this scholarly article

2015 IEEE International Test Conference (ITC) - Automated testing of bare die-to-die stacks by Marinissen, Erik Jan; De Wachter, Bart; Wang, Teng; Fiedler, Jens; Kiesewetter, Jorg; Stoll, Karsten is a scholarly article available to read on EtoBox.

Author

Marinissen, Erik Jan; De Wachter, Bart; Wang, Teng; Fiedler, Jens; Kiesewetter, Jorg; Stoll, Karsten

Publisher

IEEE

Published

2015