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About this Engineering article
Testing for MOS IC failure modes : David G. Edwards. IEEE Trans. Reliab.R-31 (1), 9 (1982) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 1983
- Field
- Engineering (Physical Sciences)