About this scholarly article

SPIE Proceedings [SPIE 29th Annual Technical Symposium - San Diego (Tuesday 20 August 1985)] Automatic Inspection and Measurement - Measures of Circularit for Automatic Inspection Applications by Illingworth, J; Kittler, J; Brook, Richard A.; Chen, Michael J. W. is a scholarly article available to read on EtoBox.

Author

Illingworth, J; Kittler, J; Brook, Richard A.; Chen, Michael J. W.

Publisher

SPIE

Published

1985