Opening book details…
About this Engineering article
Ultralow Nanoscale Wear Through Atom-by-atom Attrition in Silicon-containing Diamond-like Carbon by Bhaskaran, Harish; Gotsmann, Bernd; Sebastian, Abu; Drechsler, Ute; Lantz, Mark A.; Despont, Michel; Jaroenapibal, Papot; Carpick, Robert W.; Chen, Yun; Sridharan, Kumar is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Bhaskaran, Harish; Gotsmann, Bernd; Sebastian, Abu; Drechsler, Ute; Lantz, Mark A.; Despont, Michel; Jaroenapibal, Papot; Carpick, Robert W.; Chen, Yun; Sridharan, Kumar
- Publisher
- Nature Publishing Group; Springer Science and Business Media LLC (ISSN 1748-3387)
- Published
- 2010
- Field
- Engineering (Physical Sciences)