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About this Engineering article
Characterization of Single Bit and Multiple Cell Soft Error Events in Planar and FinFET SRAMs by Fang, Yi-Pin; Oates, Tony is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Fang, Yi-Pin; Oates, Tony
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1530-4388)
- Published
- 2016
- Language
- EN
- Field
- Engineering (Physical Sciences)