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About this Engineering article
Characterization of the OSF-band structure in n-type Cz-Si using photoluminescence-imaging and visual inspection by Søndenå, Rune; Hu, Yu; Juel, Mari; Syre Wiig, Marie; Angelskår, Hallvard is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Søndenå, Rune; Hu, Yu; Juel, Mari; Syre Wiig, Marie; Angelskår, Hallvard
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0022-0248)
- Published
- 2013
- Language
- EN
- Field
- Engineering (Physical Sciences)
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