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About this Engineering article
Comparison of Transient and Static Test Methods for Chip-to-sink Thermal Interface Characterization by B. Smith; T. Brunschwiler; B. Michel is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- B. Smith; T. Brunschwiler; B. Michel
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd; Elsevier BV (ISSN 0026-2692)
- Published
- 2009
- Language
- EN
- Field
- Engineering (Physical Sciences)