About this scholarly article

SPIE Proceedings [SPIE SPIE Europe Optics + Optoelectronics - Prague, Czech Republic (Monday 20 April 2009)] EUV and X-Ray Optics: Synergy between Laboratory and Space - Material analysis with EUV/XUV radiation using a broadband laser plasma source and optics system by Bayer, A.; Barkusky, F.; Dette, J.-O.; Döring, S.; Flöter, B.; Peth, C.; Mann, K.; Hudec, René; Pina, Ladislav is a scholarly article available to read on EtoBox.

Author

Bayer, A.; Barkusky, F.; Dette, J.-O.; Döring, S.; Flöter, B.; Peth, C.; Mann, K.; Hudec, René; Pina, Ladislav

Publisher

SPIE

Published

2009

Language

EN