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About this Engineering article
Differential pressure test: A quantitative stress test method for bonded beam-leaded devices : E. J. Boore and D. M. Sutter. Proc. 21st Electronic Components Conf. Washing D.C., U.S.A., 10–12 May (1971), p. 2 is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 1971
- Language
- EN
- Field
- Engineering (Physical Sciences)