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About this Engineering article

Electron Microscopic Studies of Co- and Ti-Germanosilicide Films Formed on SiGe Layers by Jin, S.; Donaton, R. A.; Bender, H.; Maex, K. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Jin, S.; Donaton, R. A.; Bender, H.; Maex, K.
Publisher
Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP) (ISSN 0272-9172)
Published
1998
Language
EN
Field
Engineering (Physical Sciences)

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