About this scholarly article

Time-Domain Reflectometry for Near-Field Scanning Microwave Microscopy by Farina, Marco ;Di Donato, Andrea ;Mencarelli, Davide ;Venanzoni, Giuseppe ;Morini, Antonio ;Pietrangelo, Tiziana is a scholarly article available to read on EtoBox.

Author

Farina, Marco ;Di Donato, Andrea ;Mencarelli, Davide ;Venanzoni, Giuseppe ;Morini, Antonio ;Pietrangelo, Tiziana

Publisher

IEEE

Published

2015

Language

EN