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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Optical System Alignment and Tolerancing II - A simple tool for alignment and wavefront testing: experimental results by Kuhn, William P.; Sasian, José M.; Youngworth, Richard N. is a scholarly article available to read on EtoBox.

Author
Kuhn, William P.; Sasian, José M.; Youngworth, Richard N.
Publisher
SPIE
Published
2008

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